Cathodoluminescence
Cathodoluminescence system is becoming a new collection of analytical tools for material science research, geology and pharmaceutical application. Our innovative design model CLF-2 makes it possible to perform cathodoluminescence analysis rapidly, automatically and accurately, and to generate clear structural information of the material.
Cathodoluminescence (CL) is a non-destructive technique to characterize optical and electronic properties of nanostructures in many different materials. It offers the possibility to visually see the nano-scale structure and to obtain information on the composition, growth and quality of the material. The applicable materials include semiconductors, gemstones, ceramic, glass, pharmaceutical active ingredient (API), etc.
Historically the phenomenon of cathodoluminescence had found limited analytical applications mostly due to the fact that there is no suitable system available, and the process was usually time consuming as the sample chamber requires vacuuming. Our system CLF-2 has reduced the vacuuming to just one minute, making it possible to obtain results quickly.
The CLF-2 system consists of a main unit, a vacuum sample chamber, an automatic control unit, a high-accuracy sample platform, and a stepping platform control box.
CLF-2 is designed to determine the structures and components of various materials such as quartz, diamond, calcite, dolomite, etc. It can operate in either Auto or Manual control mode. The main control box integrated with the modular High Tension (HT) was designed with high accuracy, electrical current protected, high stability and other safety features.
The CLF-2 can be extended to energy dispersive spectrometer (EDS) for identifying the elements in the spectrum, and performing semi-quantitative analysis, X-ray fluorescence (XRF). The CLF-2 can be used to acquire sample’s optical spectrum. In most situations of geological interest, it is observed that the wavelength remains constant to the naked eyes for all values of the voltage above certain threshold value. It is also found that the intensity increase as the beam current increase, in other words, as the beam current density increase.
